Machinery / Semiconductors and Automation

Visual Inspection Systems

Iwatani offers advanced one-stop solutions that encompass all processes encountered in the semiconductor manufacturing sector.

Chip Component Visual Inspection Systems

Chip Component Visual Inspection Systems

Uses Image Processing With Proprietary Software to Determine Chip Component Surfaces (4/6 Faces) System Design Ensures Consistent Inspection Accuracy and Avoids Damaging Workpieces

Features

  • Image processing details: Scratches, chipping, dirt, contamination, dimensional detection, etc.
  • Image processing speed: Varies depending on workpiece and image processing details
  • System processing speed: Max. 5,000 units/minute

Wafer Visual Inspection Systems

Wafer Visual Inspection Systems

Visual Inspection System Using Proprietary “Adaptive Learning” Inspection Function

Features

  • Inspection items: Dirt, discoloration, contamination, cracking, chipping, scratches
  • Adaptive learning software: Eliminates erroneous interpretations due to product variations.

Please inquire for more information on visual inspection systems.

Electronics Equipment Department

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