Machinery / Semiconductors and Automation
Visual Inspection Systems
Iwatani offers advanced one-stop solutions that encompass all processes encountered in the semiconductor manufacturing sector.
Chip Component Visual Inspection Systems
Uses Image Processing With Proprietary Software to Determine Chip Component Surfaces (4/6 Faces) System Design Ensures Consistent Inspection Accuracy and Avoids Damaging Workpieces
Features
- Image processing details: Scratches, chipping, dirt, contamination, dimensional detection, etc.
- Image processing speed: Varies depending on workpiece and image processing details
- System processing speed: Max. 5,000 units/minute
Wafer Visual Inspection Systems
Visual Inspection System Using Proprietary “Adaptive Learning” Inspection Function
Features
- Inspection items: Dirt, discoloration, contamination, cracking, chipping, scratches
- Adaptive learning software: Eliminates erroneous interpretations due to product variations.
Please inquire for more information on visual inspection systems.
Electronics Equipment Department
Tokyo
81-3-5405-5781
Osaka
81-6-7637-3072